Joint Test Action Group

Results: 911



#Item
481IEEE standards / Microcontrollers / Embedded systems / Debugging / Electronics manufacturing / Joint Test Action Group / Universal Serial Bus / Emulator / Nexus / Electronics / Computer hardware / Computing

_ V5.8 Hardware Reference

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Source URL: www.isystem.com

Language: English - Date: 2015-02-27 02:19:03
482IEEE standards / Software optimization / Electronics manufacturing / Joint Test Action Group / Tracing / Profiling / Nexus / Debugging / Computing / Electronics

Germany France Great Britain Italy USA China

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Source URL: www.lauterbach.com

Language: English - Date: 2010-12-13 09:10:02
483IEEE standards / Embedded systems / ARM architecture / Microprocessors / Debugging / Joint Test Action Group / Multi-core processor / ARM11 / Advanced Microcontroller Bus Architecture / Computing / Computer programming / Electronics

Debugging with ARM CoreSight

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Source URL: www.lauterbach.com

Language: English - Date: 2010-12-13 09:12:46
484Cross-platform software / Java virtual machine / Android / Embedded systems / Smartphones / Dalvik / Virtual machine / Debugging / Joint Test Action Group / Computing / Software / System software

android-debugging-1-alternativ

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Source URL: www.lauterbach.com

Language: English - Date: 2011-02-25 09:31:24
485Electronics manufacturing / Joint Test Action Group / IC power supply pin / Manufacturing / Computer buses / Electronics / Embedded systems / Electronic engineering

PDF Document

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Source URL: www.pjrc.com

Language: English - Date: 2011-10-13 08:13:32
486Embedded systems / Software / IEEE standards / GNU Debugger / Joint Test Action Group / Debugging / Kernel / In-circuit emulator / Background Debug Mode interface / Computing / Debuggers / Electronics

Integrated Run & Stop Mode Debugging for Embedded Linux

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Source URL: www.lauterbach.com

Language: English - Date: 2010-12-13 07:56:48
487BIOS / Computing / Booting / Joint Test Action Group / Dreambox / Comparison of boot loaders / System software / Linux-based devices / Software

Ethernut 2.1 Hardware Manual

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Source URL: www.ethernut.de

Language: English - Date: 2011-10-31 05:03:31
488Electronics / Digital signal processors / IEEE standards / IBM PC compatibles / Interrupts / Conventional PCI / Joint Test Action Group / PCI Express / Texas Instruments TMS320 / Computer hardware / Computer buses / Computing

4.4 DM5420 Module The DM5420 provides 12 Texas Instruments TMS320C5420 DSP chips for the V6M6 and PCI module carrier boards. Each TMS320C5420 DSP provides 2 independent DSP processors.. The modules also have 16

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Source URL: www.cacdsp.com

Language: English - Date: 2000-09-18 15:14:20
489Technology / Embedded systems / Electronics manufacturing / Joint Test Action Group

PDF Document

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Source URL: dlnware.com

Language: English - Date: 2014-11-26 03:04:21
490Electronics manufacturing / Automatic test pattern generation / Boundary scan / Joint Test Action Group / Scan chain / Fault coverage / In-circuit test / Logic simulation / Stuck-at fault / Electronic engineering / Electronics / Electronic design automation

Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . .

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Source URL: www.soft-test.com

Language: English - Date: 2013-02-18 04:29:00
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